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Semiconductor X-Ray Inspection

Viscom 3D First Class Inspection X8068

VISCOM 3D First-Class Inspection with Two inspection Concepts in One System – X8068

  • X8068 ensures that you are equipped with the ideal system. The manual semi-automatic inspection system combines two inspection concepts in one system, the Viscom XMC and the Viscom SI analysis software.
  • The X8068 is ideal for inspection objects up to 722 mm in diameter and inspects components up to 15 kg effortlessly.
  • The open, high-performance micro-focus X-ray tube ensures the highest resolution and detail recognistion in first-class image quality. With a detector swivel range of up to 60 degrees, 2.5D X-ray inspections and a correspondingly wide inspection area can be realized.
  • 3D reconstructions are made possible with Viscom XVR computed tomography. This means that the X8068 X-ray system offers optimal solutions for a wide range of inspection requirements to virtually all individual users.